Small-angle X-ray scattering (SAXS) and wide-angle X-ray scattering (WAXS) technologies generate structural insight in situ and non-destructively on length scales of 1-200 nm. Therefore, it has become an important technology for studying soft, deformable and self-assembled materials, such as those found in drug delivery systems and structural biology. For structural biology, SAXS is a supplementary technique to other standard characterization techniques such as X-ray crystallography, which can characterize structural changes in solution. For drug delivery, SAXS has long been a standard technology for obtaining the size, shape, and transformation of many common drug delivery vehicles (such as micelles, emulsion drops, liquid crystals, vesicles, and microgels). X-ray scattering is also used to study defect structures and pores in metals, ceramics, and rocks.
SAXSpoint is Anton Paar's latest generation point collimation benchtop SAXS instrument. It uses the latest advances in X-ray tube and detector technology to increase the intensity by an order of magnitude, while the minimum q is reduced by an order of magnitude. In addition to the functions of SAXSess, SAXSpoint can also perform benchtop experiments-such as dynamics and grazing incidence SAXS-previously only on synchrotron SAXS lines.
Anton Paar’s SAXSess instrument has a copper X-ray source with two vacuum beam lines: a point collimated beam line with a CCD camera and an aq range of 0.2–7 nm-1, and a Mythen bar detector The line collimates the beam line and has an aq range of 0.05-7 nm-1. By using the wide-angle scattering accessory, both beam lines can be extended to q = 40 nm-1. Both beam lines can be used for a range of samples, such as liquids, solutions, pastes, powders, gels, and solids.
The point collimated beam line is most suitable for strong scattering samples in the colloidal size domain, and is usually used to study concentrated micellar solutions, liquid crystals, suspensions of organic and inorganic particles, polymers, gels, pastes, ionic liquids and mesopores Material. The collimated beam line is most suitable for weak scattering samples. It is commonly used to study solutions of proteins, polymers and micelles.
Sydney Analytical has many instruments for characterizing particle shape, size, and interactions in solution (such as radius of gyration, hydrodynamic diameter, molecular weight, second virial coefficient, and zeta potential). The instrument includes a Malvern Zetasizer (for dynamic light scattering and zeta potential), two Malvern Nanosight instruments (hydrodynamic diameter and particle concentration) and a Brookhaven light scattering instrument (for Mw, Rg, A2 dynamic or static Light scattering).
Single crystal X-ray diffraction (SCXRD) is used to determine the structure of crystalline materials on the atomic scale, using single sub-millimeter-sized crystals. Ordered atoms scatter the X-ray beam in many different directions. By measuring the angle and intensity of the diffracted beam, the three-dimensional atomic structure of the crystal can be determined.
Rigaku Oxford Diffraction SuperNova provides a choice of copper or molybdenum X-ray sources, and is equipped with a large Atlas CCD area detector mounted on a four-circle goniometer. Molybdenum sources with shorter wavelengths can achieve higher resolution and reduce absorption effects. Copper sources with longer wavelengths are stronger and help determine the absolute structure of the light atom structure. The instrument is equipped with an Oxford Cryosystems Cyrostream 700 Plus cryogenic system based on liquid nitrogen for cryogenic data collection.
The instrument has Incoatec IµS 2.5 X-ray source, equipped with D85 four-circle kappa goniometer, the most advanced Incoatec Quaazar multilayer optics and Apex II CCD area detector. The instrument is equipped with an Oxford Cryosystems Cyrostream 700 Plus cryogenic system based on liquid nitrogen, capable of collecting 80-500K data.
This polymer single crystal X-ray diffractometer consists of a dual-port Rigaki 007HF copper rotating anode generator, each port is equipped with Osmic confocal optics, Marresearch mardtb "desktop beamline" with Mar 345 image plate detector And Oxford Cryosystems Cryostream 700 crystal cooling device based on liquid nitrogen. The system is able to determine the structure of macromolecules with atomic resolution "inside" and determine the samples that require synchrotron sources.
The following example environments are provided:
Powder X-ray diffraction also measures the structure of crystalline materials, but in this case fine powders or flat solids are used, expanding the range of applications to a wider range of materials. The crystal structure, phase composition and residual stress can be determined.
Stadi P is the most advanced laboratory powder diffractometer. The instrument is equipped with a molybdenum or copper X-ray source, has two beam lines, and is equipped with accessories to control the sample temperature from 12 K to 1000 °C:
The instrument is equipped with a robot sampler, and is equipped with a copper X-ray source and Bragg-Brentano geometry. It is an ideal choice for routine powder diffraction measurement.
The instrument is equipped with a copper X-ray source and Bragg-Brentano geometry, equipped with two high temperature stages:
The instrument also has an open Euler stand, which can be used to perform X-ray reflectometry (XRR) or residual stress measurements. The X-ray reflectometer measures the vertical depth and distribution of the detection film. The horizontal geometry of the instrument allows measurement of solid-air and liquid-air interfaces. This has been applied to thin film technologies such as catalytic interfaces, surfactant layers, adsorbent polymer layers and biofilms.
The instrument also has an open Euler stand that can be used to perform X-ray reflectometry (XRR) or residual stress measurement:
The GBA mini-material analyzer diffractometer is located in the Australian Science and Technology Park and is an optimized collection of clay and similar materials. The system has a Cu sealed tube source and a fast MtriX Multi-strip solid-state detector. The system is also equipped with Anton Paar's CHC humidity chamber, which can collect data between -5 to 400°C and 5 to 95% relative humidity (only 10-60°C).
The elemental composition of the sample can be determined by the characteristic radiation emitted by the sample after being excited by X-rays. Two techniques that exploit this phenomenon are X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS).
The PANalytical Energy Dispersive X-ray Fluorescence (XRF) benchtop spectrometer performs non-destructive analysis of elements from sodium to uranium, with concentrations ranging from 100% to ppm. The instrument is equipped with the Malvern Panalytical non-standard Omnian calibration program, which is specially configured for heavy metal analysis.
Bruker Tracer 5i is a hand-held energy dispersive XRF spectrometer, which is very suitable for analysis in the laboratory and on-site. It can analyze elements ranging from Mg to U (ranging from% to ppm levels). The system is equipped with internal cameras, 3mm and 8mm collimators, automatic internal wheel filters, and manual filter slots. The current calibration includes the calibration of metals, ceramics and rocks. You can use EasyCal software to perform custom calibrations.
The Bruker ARTAX800 µ-XRF system is a portable energy dispersive XRF spectrometer with a resolution of 70 µm, capable of point analysis and mapping. It can analyze elements from Na to U (from% to ppm level), and the rotating measuring head can analyze a variety of samples without contact, including samples that are too large to be analyzed by traditional laboratory instruments and very small samples that require high resolution Rate. Custom calibration can be performed using EasyCal software.
The instrument is located in the Sydney Nanoscience Center and is designed for surface and thin film characterization. It can perform X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS), and provide information about element composition, oxidation state and electronic state.
The Thermo Scientific MAGISTM dual-mode ion beam can use a single atom beam or gas cluster beam for depth profiling and surface cleaning, and the patented dual beam source prevents the sample from being charged, making it easy to analyze insulators.
The size of the X-ray beam can be adjusted between 30-400 um in 5 um increments, and the sample is analyzed as a single point or line. Chemical imaging is also provided, allowing the collection of distribution maps ranging in size from 0.5 mm x 0.5 mm to 3 mm x 3 mm.